Six-sigma Quality Management of Additive Manufacturing

Hui Yang, Prahalad Rao, Timothy Simpson, Yan Lu, Paul Witherell, Abdalla R. Nassar, Edward Reutzel, Soundar Kumara

In this paper, we propose to design, develop, and implement the new DMAIC methodology for Six-Sigma quality management of AM. First, we define the specific quality challenges arising from AM layer-wise fabrication and mass customization (even one-of-a-kind production). Second, we present a review of AM metrology and sensing techniques, from materials through design, process, environment, to post-build inspection. Third, we contextualize a framework for realizing the full potential of data from AM systems, and emphasize the need for analytical methods and tools. We propose and delineate the utility of new data-driven analytical methods, including deep learning, machine learning, and network science, to characterize and model the interrelationships between engineering design, machine setting, process variability and final build quality. Fourth, we present the methodologies of ontology analytics, design of experiments (DOE) and simulation analysis for AM system improvements. In closing, new process control approaches are discussed to optimize the action plans, once an anomaly is detected, with specific consideration of lead time and energy consumption.